Last Updated： Aggregation Period:Aug 05, 2026～Sep 01, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Aug 05, 2026～Sep 01, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Aug 05, 2026～Sep 01, 2026
This ranking is based on the number of page views on our site.
1～19 item / All 19 items
Non-destructive line measurement of film and sheet thickness.
First of all, each device component is designed to be simple, allowing us to introduce customized packaging that meets the needs of each customer, which is also optimal for cost reduction. We have adopted a highly reliable measurement calculation method called FFT, so you can collect data with confidence.
A film thickness measuring device designed not only for research purposes but also for use in production environments.
The "Film Thickness Measurement Device" is a product of THETA METRISIS, handled by Outex. It is a film thickness measurement system that uses white light reflection spectroscopy, capable of measuring from the nano range to the micron range. A variety of models are available to suit different applications, ranging from convenient portable types to large stationary types. We offer numerous modules necessary for measurements in high temperatures, in liquids, microscope attachment types, gas chambers, flow cells, and more. This product is designed not only for research purposes but also with an eye towards use in production environments. 【Features】 ■ Film thickness measurement system from nano range to micron range using white light reflection spectroscopy ■ A wide selection of models available to suit various applications ■ Numerous modules available ■ Usable in both research and production environments *For more details, please refer to the PDF document or feel free to contact us.
A coating that is too thick or too thin will result in defects. We will explain the management of film thickness from three aspects: dimensions, rust, and appearance.
Poor film thickness is a complaint factor that is often overlooked in visual inspections. A coating that is too thin reduces corrosion resistance, while a coating that is too thick can lead to assembly issues at screw parts, fitting parts, and around holes. In other words, film thickness is a management item that affects rust, appearance, and dimensions. Particularly in automotive parts, even a slight difference in thickness after painting can impact assembly and operation. Initially, we check for deviations from the standard values, measurement locations, production lots, and part shapes. The countermeasures involve determining measurement locations, frequency, standard values, and recording methods, as well as understanding where paint adheres easily for each part shape. If the measurement locations change every time within a lot, trends become difficult to see. By fixing the measurement points and comparing them with the production lot, it becomes easier to identify the causes. Managing film thickness also helps prevent dripping, color unevenness, and hole filling. Please utilize check materials for film thickness verification. It is more important to consistently measure the same location than to measure itself. Comparable records will serve as materials for cause investigation.
Maintains high precision and outstanding stability! Used in various fields and has gained immense trust.
We handle the "thickness measurement device" manufactured by Helmut Fischer. Because it is accurate, it helps reduce waste of paint. It can measure the correct purity of expensive materials such as gold and silver. It is non-contact, has a fast response time, and allows for continuous measurement. 【Features】 ■ Accurate, thus reducing "waste of paint" ■ Can measure the correct purity of "expensive materials" such as gold and silver ■ Non-contact with a fast response time, enabling continuous measurement ■ Easy to use and measurable by anyone *For more details, please refer to the PDF document or feel free to contact us.
USB Simple Film Thickness Measurement Device
It measures optical film thickness from 300nm to 30μm (100μm) with good reproducibility, which was not possible with conventional contact methods.
Film thickness measurement device capable of measuring film thickness on wafer glass substrates and mirror substrates.
The "LF-1000" is a non-contact automatic film thickness measurement device equipped with a spectrometer and optical interference film thickness analysis software, enabling film thickness measurement by setting various parameters. This analysis software allows for non-contact automatic measurement and mapping of the thickness, refractive index, and absorption coefficient of transparent or translucent thin films by analyzing the interference waveforms from the surface of the thin film and the interface with the substrate. 【Features】 - Capable of measuring film thickness not only on wafers and glass substrates but also on other mirror-like substrates. - Various film thickness measurements can be performed by setting the optical constants of the film. - Excellent for measuring thin film oxide layers, SOI, EG films, color filters, etc. - Comes with an auto stage compatible with standard 3, 4, 5, 6, 8, and 12-inch wafers. - Loader specifications can also be accommodated as an option (consultation available for cassette/FOUP and number of ports). - Capable of measuring film thickness from thin films to thick films depending on the measurement head specifications. - GEM communication is optional. *For more details, please refer to the PDF materials or feel free to contact us.
Variations in film thickness are not due to differences in skill. This explanation will cover management methods that reconsider measurement points, jigs, and positions within the furnace.
The film thickness varies every time it is measured. Do you think it's due to the operator's skill? The cause lies in the measurement and hanging methods. ────────────── ■Cause of Occurrence Variability in film thickness arises from differences in static electricity due to the shape of the material and inconsistencies in measurement points. Even with the same part, there can be up to a 2-fold difference in film thickness between recessed and flat areas. ■Truth If measurements are taken without determining specific points, half of the variability is measurement error. Temperature differences due to the position within the furnace also affect film thickness; a 5-degree difference inside the chamber can change fluidity. ■Improvement Measures Fix three or more measurement points on the drawing and record separately for flat and recessed areas. Check the electrical connection of the jig daily and regularly measure the temperature distribution inside the furnace. Please utilize the documentation summarizing the criteria for setting film thickness measurement points.
Infrared Non-Contact Thickness Gauge "Easy Operation and Maintenance-Free!"
<X-Y Mapping Measurement Possible> Mapping measurement is possible while moving the work in the XY direction. <Immediate Usability> Automatically creates a calibration curve from the reference piece. Measurement can be started immediately. <Maintenance-Free> There are no short-term replacement parts such as light sources or line sources.
Non-destructive measurement of coating thickness on metal and non-metal substrates.
In the energy industry, quality control of insulating materials is extremely important for safety and efficient power supply. If the thickness of the insulating material is inappropriate, it can lead to leakage or short circuits, potentially resulting in serious accidents. The QuintSonic T can non-destructively measure thicknesses of up to 8 layers and can also measure coating thickness on GFRP and CFRP, contributing to the quality control of insulating materials. 【Application Scenarios】 - Measuring the thickness of insulating coatings at power plants, substations, and transmission lines - Quality control at insulating material manufacturers - Inspection of insulating coatings at electrical equipment manufacturers 【Benefits of Implementation】 - Reduced inspection time through non-destructive testing - Increased efficiency through simultaneous measurement of multi-layer thickness - Enhanced quality control through data management functions
